{"created":"2023-05-15T12:25:38.834141+00:00","id":953,"links":{},"metadata":{"_buckets":{"deposit":"5513d6c1-2d84-4c39-8c28-e4f405e2e6c5"},"_deposit":{"created_by":4,"id":"953","owners":[4],"pid":{"revision_id":0,"type":"depid","value":"953"},"status":"published"},"_oai":{"id":"oai:kait.repo.nii.ac.jp:00000953","sets":["2:16:41:118"]},"author_link":[],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-03-20","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"54","bibliographicPageStart":"51","bibliographicVolumeNumber":"28","bibliographic_titles":[{"bibliographic_title":"神奈川工科大学研究報告.B,理工学編"}]}]},"item_10002_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"There are various types in the noise included in image, such as ar andom noise existing in photodetector and a thermal noise existing in an electronic circuit. It becomes an important indicator for evaluating an imaging system to get to know the affects of each noise. In this paper, we perform 3-dimensional analysis and consider affects of each noise. We analyze an image of ideal state where only Multiplicative Noise or Additive White Gaussian Noise exists. Further, we show that we can improve S/N with time delay integration.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.34411/00000946","subitem_identifier_reg_type":"JaLC"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"神奈川工科大学"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10074179","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09161902","subitem_source_identifier_type":"PISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"奈倉, 理一","creatorNameLang":"ja"}]},{"creatorNames":[{"creatorName":"山下, 大介","creatorNameLang":"ja"}]},{"creatorNames":[{"creatorName":"Nagura, Riichi","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"Yamashita, Daisuke","creatorNameLang":"en"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2010-02-03"}],"displaytype":"detail","filename":"kkb-028-009.pdf","filesize":[{"value":"1.9 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"kkb-028-009.pdf","objectType":"fulltext","url":"https://kait.repo.nii.ac.jp/record/953/files/kkb-028-009.pdf"},"version_id":"78199d8b-cd87-450f-9183-6e45aac86909"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Multiplicative Noise","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Additive White Gaussian Noise","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"3- dimensional information","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Time Delay lntegration","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高精細度一次元CCDによる実画像三次元画像解析の研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高精細度一次元CCDによる実画像三次元画像解析の研究","subitem_title_language":"ja"},{"subitem_title":"The Study of Real Image 3-dimensional Analysis Using High Resolution Linear CCD","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"4","path":["118"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-11-24"},"publish_date":"2020-11-24","publish_status":"0","recid":"953","relation_version_is_last":true,"title":["高精細度一次元CCDによる実画像三次元画像解析の研究"],"weko_creator_id":"4","weko_shared_id":-1},"updated":"2023-08-04T09:10:07.859919+00:00"}